Continuing Survey of Russian manufacturers of scanning probe microscopes, present
nanotechnological complex "Umka".
Concern "Nanoindustry" carried out the development of new software for the produced them nanotechnological complex "UMKA." The development of this software was carried out using an adapted technology IBM Rational. The new software greatly simplifies the use of complex, improves visualization of samples and reduces the qualification requirements for the initial training of computer users by simplifying the user interface and a more optimal operation. This facilitates the use of the microscope as a scientific and industrial organizations, as well as in any training: schools, colleges and universities.
"Umka" designed for learning and experience in carrying out work in the field of nanotechnology
Created on the basis of the scanning tunneling microscope (STM) nanotechnological complex (NTC) "UMKA" is intended for demonstration, research and laboratory work in physics, chemistry, biology, medicine, genetics, and other basic and applied sciences, including engineering works in the field of nanoelectronics. "UMKA" is an excellent tool for teaching modern practices of working with nanoscale structures. The complex is used for research in academic and industrial laboratories.
Operation tunneling microscope is significantly different from all other microscopes and based on the quantum nature of the particles. At the heart of his work lies a tunnel effect — the phenomenon of electron tunneling through a narrow potential barrier between the metal tip and the sample in an external electric field. STM provides detection of local interaction (change in current) generated between the tip and the surface of the sample upon mutual rapprochement. In the circuit comprising the needle (probe) of the sample and a voltage source, current flows. Material data and the topography of the surface is obtained by changing the distance between the sample and the tip (reducing the tunneling gap) or to change the tunneling current. With the help of an STM image of the surface can be up to atomic resolution.
The film with the tokamak wall, 0.39h0.39 microns obtained with the help of a complex UMKA
In STM "Umka-02-U» tube is horizontal. The sample is placed on the guide at a distance from the tip, and then include the automatic supply. Approach by using piezoelectric tubular elements.
For the controlled movement of the needle on the ultra-small distances in the STM uses two piezoelectric motor. Their mission — to provide precise mechanical scanning of the sample probe. With the help of coarse positioning of the sample is applied to the probe. As they approach the circuit appears tunneling current. Once it reaches a certain point, begins Smooth approach.
This scheme provides an automatic accurate positioning of the sample and the probe does not "stick" to the surface of the sample.
Island film of graphite on the surface of gold, 5.12 x 5.12 m
A carbon nanotube on the surface of graphite paper, um 0.31h0.31
The company also produces spektroellipsometr "ELF" — a universal two-channel spectral photometric ellipsometer, an electronic device that allows a method to perform ellipsometry:
— Determining the thickness of thin films and layers in the multilayer film structures;
— Determination of the spectra of the optical properties of materials;
— Study of the structure of materials;
— Analysis of the surface structure of thin surface layers.
Has a wide scope. It can be used in research and educational purposes, as well as for quality control in industrial laboratories.