I continue to familiarize with domestic manufacturers of devices for nanotechnology.
Ltd. "Nano Scan Technology" — one of the few modern domestic high-tech companies that have no basis in scientific research institute, university or industrial enterprise. The company was founded in 2007 on the private initiative of its owners and staff, alumni MIPT. Located in Dolgoprudnom Moscow region.
The company specializes in — development, production and sale of unique equipment for research and industry. In particular, the scanning probe microscopes and complexes thereof. Microscopes NST is in the top 10 popular Russian nanotechnology network equipment.
Certus — Scanning Probe Microscope (SPM)
Certus — scanning probe microscope with the ability to work with optical and spectroscopic equipment.
Construction In most existing models of the scanning probe microscope can not directly observe the probe and the sample surface, since this area is generally structurally inaccessible. For access to the contact point of the probe with the sample using different optical systems, but this operation is complicated, decreases the image quality and the useful light signal is attenuated, which is extremely important, for example, in the case of obtaining spectra surface.
The head of a scanning probe microscope Certus is designed not to cover the scanning area for optical devices. Scanner in a U-shape allows the lens to bring the optical microscope illuminator or laser light source directly to a portion of the scan. Thus, it is possible to simultaneously study by optical and scanning probe microscopy, "look and feel".
The scanning probe microscope Certus is available in several versions:
— Certus Light — a simple SPM for researchers, without the need to obtain optical images, or for those who install their own designs using SPM.
— Certus Standard — AFM with an optical microscope. Optical microscope lets you see on the surface of the sample of interest, and then explore it by scanning probe microscopy.
— Certus NSOM — scanning probe microscope (SPM), equipped with a specialized probe holder and optical equipment necessary to conduct research using near-field effect (Near-Field Scanning Optical Microscope).
The near-field optical microscopy is based on the properties of the near (evanescent) field, which allows us to overcome the classical diffraction limit of optical microscopy.
Certus Optic — combined scanning probe (SPM) and optical microscopes.
Using the research of optical microscope eliminates the limitations of scanning probe microscope related to the difficulty of finding the research object on the surface of the sample, and a scanning probe microscope allows you to explore the surface of objects beyond the resolution of the optical microscope and get a true three-dimensional images of the surface topography. Furthermore, the use of high-grade optical microscope allows for full set classical microscopy techniques such as fluorescence microscopy techniques.
At the moment there are two main options for this complex.
Cerus Optic I — Complex based on an inverted microscope (microscope objective is under the surface of the sample, and illumination can be carried out both in transmission and in reflection), which is used for the study of transparent samples. This biological samples, transparent polymers, transparent ceramic materials, etc.
In komplekss Certus Optic two integrated SPM scanner that allow for scanning a probe (the sample is stationary, moving only the probe) and a base (the probe is stationary, moving only the sample).
Certus Optic U — Complex by direct microscope (microscope objective located above the sample, and illumination can be carried out both in reflection and in transmission) is used mainly for studying opaque samples, such as ceramics, metals, etc. The IC
Centaur — Systems that combine atomic force microscope, optical microscope, confocal microscope / Raman spectrometer (Raman) scattering and fluorescence.
The principles embodied in the construction of these complexes allow both independent studies of topography and spectral characteristics of the surface and at the same time receive a spectral and topographic characteristics of the objects. This enables an unambiguous mapping the surface topography of its structure and composition. Furthermore, the complexes can receive Centaur separate spectrum in each test point (FSI — Full spectral imaging), and not only the intensity at the selected spectral feature strongly as in the previous generation devices.
This combination is necessary for a number of reasons. Typically, laboratories same sample trying to study various methods in various devices, but there are several problems. There is no certainty that will be explored is the same section of th
e sample on different instruments and there is no guarantee that the transfer of the sample from one instrument to another, he will not change and will not be destroyed in the course of research on one of the devices. Therefore, for objects with severe micro-and nano-structure is important to get as much information in a single measurement or series of measurements, but one instrument. To do this, install and constructed, combining a set of different techniques.
In addition, the combination of different techniques can be observed completely new effects such as the increase of Raman scattering on the needles SPM (TERS — Tip-Enhanced Raman Scattering), there is an opportunity to work with an aperture near-field microscopy, etc.
The combination of Raman spectroscopy (Raman) scattering, fluorescence spectroscopy and scanning probe microscopy complexes Centaur can carry out research in physics, chemistry, biology, interdisciplinary sciences such as materials science, pharmaceutical, biotechnology and nanotechnology. This is a study of the composition, structure and interaction of organic and inorganic materials, the characteristics of the structure of biological cells and micro-electromechanical systems (MEMS), and more.
In "Nano Scan Technology" at the moment are developed 4 versions of such complexes. Two models of classic single monochromators (Centaur I / U) And two monochromators model Double dispersion (Centaur I / U HR). Centaur model focused mainly on work with fluorescence, and the model Centaur HR to work with the combination (Raman) scattering.
Model I — Based on the inverted (inverted) optical microscope.
Model U — On the basis of direct (upright) optical microscope.
Research system Snotra is a combination of scanning probe microscopy (AFM, SPM, AFM) and krioultramikrotoma.
This system allows the in-situ Morphology and properties of the measurement sample surface immediately after cutting hyperfine at low temperatures. This technique allows to obtain a qualitatively new information on the physical and structural properties of biological and polymeric materials at the level of individual macromolecular components and study of three-dimensional nanostructures in the bulk materials.
The basis is the idea of a combined instrument measurement sample surface after cutting using SPM — not themselves slices typically studied by transmission electron microscopy (TEM). This eliminates the need to carry cut in optical or electron microscope, but if necessary, the sections were possible to study on electronic and optical microscope to compare the different methods.
In addition to measuring instruments and systems company "Nano Scan Technology" produces devices for developers and manufacturers of scientific and industrial equipment. This scanning pezostoliki Ratis and one-coordinate shifts Vectus. They also take into account the requirements for working with optical equipment.
Scanners Ratis XY (Z) used in scanning probe microscopes, devices, precision positioning and movement. They allow you to move the sample at a distance of 150mkm to within a fraction of a nanometer. In particular, these scanners are incorporated into complexes Certus Optic and Centaur.
One-coordinate shifts Vectus designed for moving and positioning devices for one coordinate, e.g., an optical microscope objective (for more precise focusing and automatic focusing) and a number of other devices — lasers manipulators etc.
To manage all these devices use specialized controllers series EG-3000 and EG-1000, as well as specialized softwareNSpec.
Detailed specifications of the presented equipment, circuit diagrams and dimensional drawings are available on the links.