NT-MDT at the exhibition MRS in Boston, USA

NT-MDT — Russian manufacturer of research instruments that can address a wide range of tasks in the field of nanometer size. 

Company NT-MDT took part in the traditional exhibition of research equipment accompanying the annual conference of the International Materials Research Society (Materials Research Society, MRS). The conference took place from 25 to 30 November in Boston, USA. Since modern materials science affects almost all areas of human activity, the conference traditionally attracts wide interest among the representatives of science, industry and government organizations.

Traditionally, the exhibition, taking place simultaneously with the conference, present their latest achievements virtually all significant firms engaged in the production of scanning probe microscopes.

Presented at the exhibition exposition NT-MDT was impressive as ever. For the first time the general public were shown two completely new device — SPECTRUM and OPEN, as well as significantly updated device NEXT.

SPECTRUM — Is a powerful measurement system that includes a wide range of methods for scanning probe microscopy and optical microscopy / spectroscopy.

4 probe sensor heads SPECTRUMa allow STM and AFM measurements (including liquid) with different types of probe sensors and micromechanical tuning forks, using virtually all known methods and techniques of scanning probe microscopy.

SPECTRUM and also provides the greatest opportunity the optical measurements, including widefield microscopy, confocal microscopy and spectroscopy, including Raman, near-field optical microscopy.

A distinctive feature of the design of complex SPECTRUM is the possibility of measuring simultaneously with the optical probe, while ensuring not only the total, but a synergistic effect. In particular, the AFM probe can be simultaneously and SNOM probes, conducting AFM measurements in conjunction with Raman spectroscopy opens up the possibility of using the effect of the probe amplification, the so-called TERS spectroscopy.

All of this makes SPECTRUM unique measuring complex, which was confirmed by receiving an award R & D 100.



The second part of project for a new device — AFM / STM measurement system OPEN — Is seen as the instrument of general application, which has the widest range of probe measurement methods. When this measure is provided with an atomic resolution, not only using the STM, but amplitude modulation AFM including liquid.

OPENa feature is the "openness" of the design, which allows for scanning a sample and the probe, use interchangeable scanners (1 -, 3 -, and 100-micron), a set of tables and replacement cells for use in a liquid in a controlled atmosphere, heated and cooling of the sample for electrochemical measurements.

OPEN distinguished by a high degree of automation, in particular, an automatic adjustment of the registration system of the laser-photodiode cantilever, sample positioning, installation of software settings, greatly facilitates the measurement beginners.   



Significant modernization was AFM / STM complex NEXT, drifts significantly reduced (up to 10 nm / h) and the noise level (up to 15 pm in the 1000 Hz band).

Greatly enhanced measurement capabilities NEXTa thanks to new algorithms work and the controller PX Ultra. Using the algorithm SmartDescent supply a pointed tip to the sample is carried out with a soft touch its surface, greatly facilitating the achievement of the atomic and molecular resolution in the scanning process. Algorithms Multiscan (multiplication precision positioners video microscope and the sample) and ScanStich (cross-linking scans) can receive scanned images of optical and millimeter-sized, but with limit permits. Mutual binding coordinate movement of the sample and probe software allows for target designation cursor to select the scan area or working cantilever. It has become possible to carry out precise overlay of scanned images on the optical zoom and continuous images of nanoscale atomic-resolution optical images of up to millimeter sizes.

NEXT takes full advantage of the rich capabilities of the controller PX Ultra with its 5 synchronous detectors, 3 generators, flexibility in the organization of feedback. It has become possible to carry out multi-frequency AFM and SEM measurements, single-pass measurements of the surface potential, etc.   

In general, the exposure of NT-MDT (occupied, by the way, the central place on the show), and the interest in it on the part of the participants reiterated that the NT-MDT is surely among the top three leading manufacturers of scanning probe microscopes.

Moreover, a series of new devices SPECTRUM and OPEN, including substantially revised NEXT, actually sets the new standard — "Automated probe microscopes." With devices that meet this standard will be able to work not only academics and students but also the rank and file employees of the laboratory performing routine measurements.

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